Degradation Analysis of Thin Mg-xAg Wires Using X-ray Near-Field Holotomography
نویسندگان
چکیده
Magnesium–silver alloys are of high interest for the use as temporary bone implants due to their antibacterial properties in addition biocompatibility and biodegradability. Thin wires particular can be used scaffolding, but determination degradation rate homogeneity using traditional methods is difficult. Therefore, we have employed 3D imaging X-ray near-field holotomography with sub-micrometer resolution study thin (250 ?m diameter) Mg-2Ag Mg-6Ag wires. The were studied two states, recrystallized solution annealed assess influence Ag content precipitates on degradation. Imaging was after Dulbecco’s modified Eagle’s medium 10% fetal bovine serum 1 7 days. At 3 days immersion rates both states similar, at higher silver annealing lead decreased rates. opposite observed pitting factor. Overall, standard deviation determined parameters high, owing relatively small field view during inhomogeneity samples. Nevertheless, state emerges a potential material wire manufacturing implants.
منابع مشابه
X-ray near-field speckle: implementation and critical analysis
The newly introduced coherence-based technique of X-ray near-field speckle (XNFS) has been implemented at 8-ID-I at the Advanced Photon Source. In the near-field regime of high-brilliance synchrotron X-rays scattered from a sample of interest, it turns out that, when the scattered radiation and the main beam both impinge upon an X-ray area detector, the measured intensity shows low-contrast spe...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملNano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy
ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...
متن کاملThin glass shell oriented to Wide Field X-ray telescope
The next generation wide-field X-ray telescope (WFXT), to be implemented beyond eRosita and proposed within the NASA RFI call 2011, requires an angular resolution of less than 10 arcsec (with goal of 5”) constant across a wide field of view (1 deg). To achieve this requirement the design is based on nested modified grazing incidence Wolter-I mirrors with polynomial profiles. Our goals in terms ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Metals
سال: 2021
ISSN: ['2075-4701']
DOI: https://doi.org/10.3390/met11091422